东北大学学报（自然科学版）

东北大学学报(自然科学版) ›› 2011, Vol. 32 ›› Issue (4): 529-532.DOI: -

• 论著 • 上一篇    下一篇

高斯粗糙表面辐射特性的数值研究

蔡九菊;王爱华;   

  1. 东北大学国家环境保护生态工业重点实验室;
  • 收稿日期:2013-06-19 修回日期:2013-06-19 发布日期:2013-04-04
  • 通讯作者: -
  • 作者简介:-
  • 基金资助:
    国家高新技术研究发展计划项目(2009AA05Z215,2008AA042901)

Modeling the radiative properties of Gaussian rough surfaces

Cai, Jiu-Ju (1); Wang, Ai-Hua (1)   

  1. (1) SEPA Key Laboratory on Eco-Industry, Northeastern University, Shenyang 110819, China
  • Received:2013-06-19 Revised:2013-06-19 Published:2013-04-04
  • Contact: Wang, A.-H.
  • About author:-
  • Supported by:
    -

RichHTML

0

PDF (PC)

706

摘要： 采用时域有限差分法和近场—远场变换对两种不同材料的一维微尺度高斯粗糙表面辐射特性进行了数值模拟,并将计算结果与其他方法进行了对比分析.研究结果表明,对于理想导电材料表面,随着均方根粗糙度的增加,其双向反射率的尖峰值逐步减小并最终消失;随着均方根粗糙度与表面关联距离之比的增加,向后反射变得愈加明显;相同表面轮廓特征条件下,理想导电材料与硅粗糙表面的双向反射率的总体趋势相同但后者要远小于前者;随着入射角度的增大,理想导电材料粗糙表面的双向反射变得趋于像镜面反射.

关键词: 双向反射率, 高斯粗糙表面, 时域有限差分法, 麦克斯韦方程, 理想导电材料

Abstract: The radiative properties of two different materials surfaces with one-dimensional microscale Gaussian roughness were numerically investigated with an FDTD (finite-difference time-domain) method and near-to-far-field transformation. Calculated results were compared with those from other two approaches. The bi-directional reflectivity peak decreased gradually and eventually disappeared with increasing perfectly electric conductor (PEC) surface RMS (root mean square) roughness. The retroreflection became evident as the ratio of RMS roughness to surface correlation distance increased. Given identical surface characteristics, the overall trend of the bi-directional reflectivity was the same for both PEC and silicon surfaces although the latter was much lower than the former. The reflection of the PEC surface became more like a mirror surface as incident angle increased.

中图分类号: