Journal of Northeastern University(Natural Science)

Journal of Northeastern University ›› 2006, Vol. 27 ›› Issue (8): 875-878.DOI: -

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XPS analysis of chromate passive film deposited on tinplate

Qi, Guo-Chao (1); Gong, Xue-Nan (2); Sun, De-En (3); Liu, Chun-Ming (1)   

  1. (1) School of Materials and Metallurgy, Northeastern University, Shenyang 110004, China; (2) Cold Rolling Mill, Baoshan Iron and Steel Co. Ltd., Shanghai 201900, China; (3) School of Mechanical and Production Engineering, Nanyang Technological University, Singapore 639798, Singapore
  • Received:2013-06-23 Revised:2013-06-23 Online:2006-08-15 Published:2013-06-23
  • Contact: Qi, G.-C.
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Abstract: The composition of chromate passive film deposited on commercial tinplate via a cathodic dichromate treatment was examined with X-ray photoelectron spectroscopy (XPS). The elements Cr, O and Sn are confirmed in the film together with a certain C as amount of contaminant. The thickness of the passivation layer is found about 20 nm. Narrow scan was carried out for the film's phase composition and showed that it consists mainly of Cr(OH)3, Cr2O3, Sn and SnOx, . The formation of chromate conversion film involves the hydrolysis, polymerization, and condensation of Cr(OH)3 and Cr2O3.

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