A Displacement Measurement Method of Micro/Nano Scale Based on Neighbor Principal Feature Matching
LIU Yong-jun1,2， WEI Yang-jie1， WANG Yi1
1. School of Computer Science & Engineering， Northeastern University， Shenyang 110819， China; 2. School of Computer Science and Engineering， Changshu Institute of Technology， Changshu 215500， China.
LIU Yong-jun， WEI Yang-jie， WANG Yi. A Displacement Measurement Method of Micro/Nano Scale Based on Neighbor Principal Feature Matching[J]. Journal of Northeastern University Natural Science, 2017, 38(2): 195-199.
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