XIAO Dayu, CAI Pengfei, LI Hong, KANG Yan. A Gain Correction Method Based on Threshold for FlatPanel Detector[J]. Journal of Northeastern University Natural Science, 2014, 35(2): 208-211.
[1] 张定华,卜昆,毛海鹏.体积CT系统中的平板探测器校正方法[J].仪器仪表学报,2005,26(2):157/163.(Zhang Dinghua,Bu Kun,Mao Haipeng.Accurate and efficient calibration method for a selenium flatpanel detectorbased volume tomographic angiography imaging system[J].Chinese Journal of Scientific Instrument,2005,26(2):157/163.) [2] Antonuk L E,Boudry J,Huang W,et al.Demonstration of megavoltage and diagnostic xray imaging with hydrogenated amorphous silicon arrays[J].Medical Physics,1992,19(6):1455/1466. [3] Zhao W,Rowlands J A.Largearea solid state detector for radiology using amorphous selenium[C]//Medical Imaging VI:Instrumentation.Newport Beach,1992:134/143. [4] 周正干,滕升华,江巍,等.X射线平板探测器数字成像及其图像校准[J].北京航空航天大学学报,2004,30(8):698/701.(Zhou Zhenggan,Teng Shenghua,Jiang Wei,et al.Xray flatpaneldetectorbased digital radiography and its image calibration[J].Journal of Beijing University of Aeronautics and Astronautics,2004,30(8):698/701.) [5] Jakubek J.Data processing and image reconstruction methods for pixel detectors[J].Nuclear Instruments and Methods in Physics Research,2007,576(1):223/234. [6] Siewerdsen J H,Jaffray D A.Conebeam computed tomography with a flatpanel imager:magnitude and effects of xray scatter[J].Medical Physics,2001,28(2):220/231. [7] Zhang H,Huang K,Shi Y.A new correction method for flat panel detector in conebeam CT[J].Procedia Engineering,2011,15:2655/2659. [8] Partridge M,Hesse B M,Müller L.A performance comparison of direct and indirectdetection flatpanel imagers[J].Nuclear Instruments and Methods in Physics Research,2002,484(1/2/3):351/363. [9] 王苦愚,张定华,黄魁东,等.一种锥束 CT 中平板探测器输出图像校正方法[J].计算机辅助设计与图形学学报,2009,21(7):954/961.(Wang Kuyu,Zhang Dinghua,Huang Kuidong,et al.A calibrating method of flat panel detector based on cone beam computed tomography[J].Journal of ComputerAided Design & Computer Graphics,2009,21(7):954/961.) [10] Wang X,Han Y,Si J.Nonuniformity emendation technique for amorphous silicon flatpanel detectors used for industrial xray digital radiography[J].Measurement,2008,41(7):817/822.