东北大学学报(自然科学版) ›› 2013, Vol. 34 ›› Issue (12): 1747-1750.DOI: 10.12068/j.issn.1005-3026.2013.12.018

• 材料与冶金 • 上一篇    下一篇

基于红外热像仪的物体表面发射率测量方法

白敬晨1,于庆波1,胡贤忠1,王浩2   

  1. (1东北大学国家环境保护生态工业重点实验室,辽宁沈阳110819;2辽宁省计量科学研究院,辽宁沈阳110819)
  • 发布日期:2013-07-09
  • 通讯作者: 白敬晨
  • 作者简介:白敬晨(1989-),男,辽宁抚顺人,东北大学博士研究生;于庆波(1966-),男,山东莱阳人,东北大学教授,博士生导师.
  • 基金资助:
    国家科技支撑计划项目(2013BAA03B03);国家自然科学基金资助项目(51274066).

Surface Emissivity Measurement Technique Based on Infrared Thermal Imager〓

BAI Jingchen1, YU Qingbo1, HU Xianzhong1, WANG Hao2   

  1. 1. SEPA Key Laboratory on Ecoindustry,Northeastern University, Shenyang 110819, China; 2. Liaoning Provincial Institute of Measurement, Shenyang 110819, China.
  • Published:2013-07-09
  • Contact: YU Qingbo
  • About author:-
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摘要: 目前利用红外热像仪难以测得物体准确的发射率,因此根据红外热像仪对物体的输出响应,提出了一种新的利用红外热像仪精确测量物体发射率的方法.该方法针对双参考体方法计算公式中n取值不准确之处加以改进,推导出了物体发射率新的计算公式,系统地分析了该方法精确测量物体发射率的条件,建立了一套完整的利用红外热像仪精确测量物体发射率的方法.实验验证表明该方法可获得满意的测量结果.

关键词: 红外辐射, 红外热像仪, 温度, 发射率, 测量技术

Abstract: The tworeferencebody method can not measure accurately the emissivity of an object.According to the spectral response of an infrared thermal imager, a new precise measurement method with an infrared thermal imager was developed to measure the emissivity of an object. The determination of the parameter n in the tworeferencebody method is improved, and a new formula for emissivity calculation is obtained. Based on the analysis of the applicable conditions of the new measurement method, a measuring method to obtain accurate object emissivity is presented. Applications show that the measurement results are satisfactory.

Key words: infrared radiation, infrared thermal imager, temperature, emissivity, measurement technique

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