YANG Qiang, DAI Peng-fei, QIU Hao, SUN Zhi-li. Modeling and Evaluation of the Mating Error Influences to the Fatigue Life of a Electrical Connector[J]. Journal of Northeastern University Natural Science, 2018, 39(5): 668-673.
[1]杨奋为.航天电连接器的选用[J].机电元件,2000,19(4):57-62. (Yang Fen-wei.Selection of aerospace electrical connector [J].Mechanical and Electronic Components,2000,19(4):57-62.) [2]Ying L,Zhu F L,Duan K,et al.Analysis of insertion force of electric connector based on FEM[C]//21st International Symposium on Physical and Failure Analysis of Integrated Circuits.Marina Bay Sands,2014:195-198. [3]Jian S,Koch C,Wang L L.Nanoscale particles modified gold plating for electrical contacts[C]//26th International Conference on Electrical Contacts.Beijing,2012:331-337. [4]于红光.Micro-USB 电连接器无铅焊点热疲劳寿命研究[D].成都:电子科技大学,2014:45-50.