Journal of Northeastern University(Natural Science) ›› 2013, Vol. 34 ›› Issue (12): 1747-1750.DOI: 10.12068/j.issn.1005-3026.2013.12.018

• Materials & Metallurgy • Previous Articles     Next Articles

Surface Emissivity Measurement Technique Based on Infrared Thermal Imager〓

BAI Jingchen1, YU Qingbo1, HU Xianzhong1, WANG Hao2   

  1. 1. SEPA Key Laboratory on Ecoindustry,Northeastern University, Shenyang 110819, China; 2. Liaoning Provincial Institute of Measurement, Shenyang 110819, China.
  • Published:2013-07-09
  • Contact: YU Qingbo
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Abstract: The tworeferencebody method can not measure accurately the emissivity of an object.According to the spectral response of an infrared thermal imager, a new precise measurement method with an infrared thermal imager was developed to measure the emissivity of an object. The determination of the parameter n in the tworeferencebody method is improved, and a new formula for emissivity calculation is obtained. Based on the analysis of the applicable conditions of the new measurement method, a measuring method to obtain accurate object emissivity is presented. Applications show that the measurement results are satisfactory.

Key words: infrared radiation, infrared thermal imager, temperature, emissivity, measurement technique

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